Confocal Raman - AFM SNOM

Confocal Raman - AFM SNOM
WITec ALPHA300 RS

Combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging techniques, simultaneous Raman-AFM analysis, TERS, and nearfield-Raman (Raman-SNOM) imaging can be easily performed.

		Main instrumental features: Spatial resolution beyond the diffraction limit Ease-of-use in air and liquids Various Atomic Force Microscopy modes included Non-destructive imaging technique with minimal, if any, sample preparation Upgradeable with confocal Raman imaging in one microscope.