X-ray Diffractometer
Rigaku, Smartlab
The Smartlab combines in a unique apparatus, the facilities of conventional θ-θ diffractometer (for phase analysis and thin films characterization) and those of an Eulerian cradle diffractometer (for pole figure and strain/stress analyses). Accurate measurements of thin film thickness, roughness and density are achievable through X-ray reflectivity (XRR) techniques. Small Angle X-ray Scattering (SAXS) will allow particle size distributions of nanoparticles suspended in solution.
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Main instrumental features:
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