X-ray Diffractometer
Rigaku, Smartlab
The Smartlab combines in a unique apparatus, the facilities of conventional θ-θ diffractometer (for phase analysis and thin films characterization) and those of an Eulerian cradle diffractometer (for pole figure and strain/stress analyses). Accurate measurements of thin film thickness, roughness and density are achievable through X-ray reflectivity (XRR) techniques. Small Angle X-ray Scattering (SAXS) will allow particle size distributions of nanoparticles suspended in solution.
Main instrumental features:
- Automatic alignment
- Resolution ranging from 0.05° to 0.0015° depending on the used optics
- XRR analysis of multilayers
- Micro diffraction geometry
- In-plane measurements
- SAXS and Ultra-SAXS
